ZEILR

Special Contact Mode AFM Probe

NanoWorld Pointprobe® ZEILR probes are designed for owners of the Zeiss Veritekt or a Seiko Instruments microscope using the contact mode. Compared to the Pointprobe® contact mode probes of the CONT type the force constant is slightly increased.
The probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid. Additionally this probe offers excellent tip radius of curvature.

tip

shape: Standard

typicalfrom_toguaranteed
height 10 µm 10 - 15 µm -
radius 8 nm - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm 445 - 455 µm -
width 55 µm 50 - 60 µm -
thikness 4 µm 3.5 - 4.5 µm -
force_constant 1.6 N/m 1 - 1 N/m -
resonance_frequency 27 kHz 23 - 31 kHz -
NanoWorld
Артикул Цена Количество
544--ZEILR-10 38024.43
544--ZEILR-20 61727.93
544--ZEILR-50 126517.49
544--ZEILR-W 608600.48