ZEIHR

Special Tapping Mode AFM Probe

NanoWorld Pointprobe® ZEIHR probes are designed for owners of the Zeiss Veritekt microscope using the step mode (non-contact mode). Compared to the Pointprobe® non-contact probes of the NCH and NCL type the force constant is reduced and the resonance frequency is lower. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid. Additionally this probe offers excellent tip radius of curvature.

tip

shape: Standard

typicalfrom_toguaranteed
height 10 µm 10 - 15 µm -
radius 8 nm - 12 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 mm 220 - 230 mm -
width 57 µm 52.5 - 62.5 µm -
thikness 5 µm 4.5 - 5.5 µm -
force_constant 27 N/m 17 - 17 N/m -
resonance_frequency 130 kHz 110 - 150 kHz -
NanoWorld
Артикул Цена Количество
543--ZEIHR-10 38024.43
543--ZEIHR-20 61727.93
543--ZEIHR-50 126517.49
543--ZEIHR-W 608600.48