TESP-SS

SuperSharp, Tapping Mode AFM Probe

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

 
    This probe offers unique features:
        - excellent tip radius of curvature
        - guaranteed tip radius of curvature 5 nm (yield >80%)
 

This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Veeco Instruments Inc. is no longer selling this probe which has always been manufactured by NanoWorld®.

tip

shape: Supersharp

typicalfrom_toguaranteed
height 10 µm 10 - 15 µm -
radius 2 nm - 5 nm
half_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm 120 - 130 µm -
width 30 µm 25 - 35 µm -
thikness 4 µm 3.5 - 4.5 µm -
force_constant 42 N/m 21 - 21 N/m -
resonance_frequency 320 kHz 250 - 390 kHz -
NanoWorld
Артикул Цена Количество
534--TESP-SS-10 76266.07
534--TESP-SS-20 130204.7
534--TESP-SS-50 277482.44
534--TESP-SS-380 1365216.14