SiNi

Silicon Nitride AFM Probe
This competitively priced silicon nitride AFM probe features:
- 4 silicon nitride cantilevers for soft contact mode with two different lengths and force constants, mounted on standard silicon support chip;
- silicon nitride wedge tip
- overall tip height is 12 μm (effective > 450 nm) with a double tip spacing of 450 μm.
- Macroscopic half cone angle is 35°.

Consistent high quality at a lower price!

tip

shape: Pyramide

typicalfrom_toguaranteed
height12 µm10 - 14 µm-
radius15 nm--
half_cone_angle---

cantilever

shape: Triangular

typicalfrom_toguaranteed
length100 µm90 - 110 µm-
width16 µm11 - 21 µm-
thickness520 nm470 - 570 nm-
force_constant0.27 N/m--
resonance_frequency30 kHz--
BudgetSensors
Артикул Цена Количество
509--SiNi-30 44345.36
509--SiNi-100 123357.02
509--SiNi-300 338795.48