SSS-SEIHR

SuperSharp, Special Tapping Mode AFM Probe

For owners of a Seiko Instruments microscope using the non-contact mode we recommend the NANOSENSORS™ SEIH  type (Seiko Instruments / high force constant). Compared with the ZEIH type the force constant is further reduced.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

 
    The probe offers unique features:
        - excellent tip radius of curvature
        - typical aspect ratio at 200 nm from tip apex in the order of 4:1
        - highly doped to dissipate static charge
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

tip

shape: Supersharp

typicalfrom_toguaranteed
radius 2 nm - 5 nm
half_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 215 - 235 µm -
width 33 µm 30 - 45 µm -
thikness 5 µm 4 - 6 µm -
force_constant 15 N/m 5 - 5 N/m -
resonance_frequency 130 kHz 96 - 175 kHz -
NANOSENSORS
Артикул Цена Количество
521--SSS-SEIHR-10 76792.82
521--SSS-SEIHR-20 131152.84
521--SSS-SEIHR-50 279378.71
521--ESD-Kit 15374.42