SuperSharp, Tapping Mode AFM Probe with Long Cantilever

NANOSENSORS™ SSS-NCL probes are designed for non-contact mode or tapping mode AFM. It is offered as an alternative to the NANOSENSORS™ high frequency non contact type (NCH). The SSS-NCL is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

    The probe offers unique features:
        - excellent tip radius of curvature
        - typical aspect ratio at 200 nm from tip apex in the order of 4:1
        - monolithic material
        - highly doped to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series


shape: Supersharp

radius 2 nm - 5 nm
half_cone_angle - - -


shape: beam

length 225 µm 215 - 235 µm -
width 38 µm 30 - 45 µm -
thikness 7 µm 6 - 8 µm -
force_constant 48 N/m 21 - 21 N/m -
resonance_frequency 190 kHz 146 - 196 kHz -
Артикул Цена Количество
656--SSS-NCL-10 76792.82
656--SSS-NCL-20 131152.84
656--SSS-NCL-50 279378.71
656--ESD-Kit 15374.42