SSS-NCH

SuperSharp, Tapping Mode AFM Probe

NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.


    The probe offers unique features:
        - excellent tip radius of curvature
        - typical aspect ratio at 200 nm from tip apex in the order of 4:1
        - monolithic material
        - highly doped to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity

tip

shape: Supersharp

typicalfrom_toguaranteed
radius 2 nm - 5 nm
half_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm 115 - 135 µm -
width 30 µm 30 - 45 µm -
thikness 4 µm 3 - 5 µm -
force_constant 42 N/m 10 - 10 N/m -
resonance_frequency 330 kHz 204 - 497 kHz -
NANOSENSORS
Артикул Цена Количество
657--SSS-NCH-10 76792.82
657--SSS-NCH-20 131152.84
657--SSS-NCH-50 279378.71
657--ESD-Kit 15374.42