Electrical, Force Modulation AFM Probe

NanoWorld Pointprobe® EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields a very high force sensitivity, while simultaneously enabling tapping™ and lift mode operation. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.


This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Veeco Instruments Inc. is no longer selling this probe which has always been manufactured by NanoWorld®.


shape: Standard

height - 10 - 15 µm -


shape: beam

length 225 µm 220 - 230 µm -
width 28 µm 22.5 - 32.5 µm -
thikness 3 µm 2.5 - 3.5 µm -
force_constant 2.8 N/m 1.2 - 1.2 N/m -
resonance_frequency 75 kHz 60 - 90 kHz -
Артикул Цена Количество
507--SCM-PIT-10 48875.37
507--SCM-PIT-20 81322.82
507--SCM-PIT--50 169710.53
507--SCM-PIT--W 829938.48