Electrical, Contact Mode AFM Probe

NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Veeco Instruments Inc. is no longer selling this probe which has always been manufactured by NanoWorld®.


shape: Standard

height - 10 - 15 µm -


shape: beam

length 450 µm 445 - 455 µm -
width 50 µm 45 - 55 µm -
thikness 2 µm 1.5 - 2.5 µm -
force_constant 0.2 N/m 0.07 - 0.07 N/m -
resonance_frequency 13 kHz 9 - 17 kHz -
Артикул Цена Количество
506--SCM-PIC-10 48875.37
506--SCM-PIC-20 81322.82
506--SCM-PIC-50 169710.53
506--SCM-PIC-W 829938.48