Q-SiNi

Premounted Silicon Nitride AFM Probe, for Quesant/Ambios AFM systems

This competitively priced silicon nitride AFM probe features:
- 4 silicon nitride cantilevers for soft contact mode with two different lengths and force constants, mounted on standard silicon support chip;
- silicon nitride wedge tip
- overall tip height is 12 μm (effective > 800 nm) with a double tip spacing of 4.5 μm.
- Macroscopic half cone angle is 35°.

Consistent high quality at a lower price!


Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors SiNi AFM probe.

tip

shape: Pyramid

typicalfrom_toguaranteed
height 12 µm 10 - 14 µm -
radius 15 nm - -
half_cone_angle - - -

cantilever

shape: triangular

typicalfrom_toguaranteed
length 200 µm 190 - 210 µm -
width 30 µm 25 - 35 µm -
thikness 520 nm 470 - 570 nm -
force_constant 0.06 N/m - -
resonance_frequency 10 kHz - -
BudgetSensors
Артикул Цена Количество
566--Q-SiNi-15 42765.13