Q-MFM

Premounted Hard Magnetic, Medium Momentum AFM Probe, for Quesant/Ambios AFM systems

Silicon based beam deflection cantilever for Magnetic Force Microscopy with magnetic coating on tip side and aluminum coating on detector side of the cantilever.

Tip radius below 60 nm.

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors MagneticMulti75-G AFM probe.

tip

shape: Rotated

typicalfrom_toguaranteed
height 17 µm 15 - 19 µm -
setback 15 µm 10 - 20 µm -
radius 60 nm - -
half_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 215 - 235 µm -
width 28 µm 23 - 33 µm -
thikness 3 µm 2 - 4 µm -
force_constant 3 N/m 1 - 1 N/m -
resonance_frequency 75 kHz 60 - 90 kHz -
BudgetSensors
Артикул Цена Количество
494--Q-MFM-10 43818.62