Q-EFM

Premounted Electrical, Tapping Mode AFM Probe, for Quesant/Ambios AFM systems

Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for non-contact high frequency applications (intermittent contact, tapping in air) and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

Consistent high quality at a lower price!

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a BudgetSensors ElectriMulti75 AFM probe.

tip

shape: Rotated

typicalfrom_toguaranteed
height 17 µm 15 - 19 µm -
setback 15 µm 10 - 20 µm -
radius 10 nm - -
half_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 215 - 235 µm -
width 28 µm 23 - 33 µm -
thikness 3 µm 2 - 4 µm -
force_constant 3 N/m 1 - 1 N/m -
resonance_frequency 75 kHz 60 - 90 kHz -
BudgetSensors
Артикул Цена Количество
493--Q-EFM-10 43818.62