Premounted High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever, for Quesant/Ambios AFM systems

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™  mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored tips showing a high aspect ratio portion with near-vertical sidewalls.

    These probes offer unique features:

        - length of the high aspect ratio portion of the tip > 2 µm
        - typical aspect ratio of this portion in the order of 7:1 (when viewed from side as well as along
          cantilever axis)
        - half cone angle of the high aspect ratio portion typically < 5°
        - excellent tip radius of curvature

Premounted AFM probe on a Quesant T-plate for Quesant AFM systems. Based on a NanoWorld NW-AR5-NCLR AFM probe.


shape: High-Aspect-Ratio

height - 10 - 15 µm -
radius 10 nm - -


shape: beam

length 225 µm 220 - 230 µm -
width 38 µm 33 - 43 µm -
thikness 7 µm 6.5 - 7.5 µm -
force_constant 48 N/m 31 - 31 N/m -
resonance_frequency 190 kHz 160 - 210 kHz -
Артикул Цена Количество
490--Q-AR5-10 97546.55
490--ESD-Kit 15374.42