Electrical, Contact Mode AFM Probes

NANOSENSORS PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM) The CONT type is optimized for high sensitivity due a low force constant. For applications that require a wear resistant and electrically conductive tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).

   This probe offers unique features:
      - platinum silicide coating with excellent conductivity and good wear-out behaviour
      - chemically inert
      - high mechanical Q-factor for high sensitivity
      - alignement grooves on backside of the holder chip.

This product features alignment grooves on the back side of the holder chip.


shape: Standard

radius 25 nm - -


shape: beam

length 450 µm 440 - 460 µm -
width 50 µm 42.5 - 57.5 µm -
thikness 2 µm 1 - 3 µm -
force_constant 0.2 N/m 0.02 - 0.02 N/m -
resonance_frequency 13 kHz 6 - 21 kHz -
Артикул Цена Количество
949--PtSi-CONT-10 142530.52
949--PtSi-CONT-20 248722.19
949--PtSi-CONT-50 530958.36