Special Contact Mode AFM Probe

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Zeiss Veritekt or Seiko Instruments microscope using contact mode we recommend NANOSENSORS™ PPP-ZEILR (Zeiss Veritekt / low force constant). Compared to the contact mode AFM probe (CONT) the force constant is slightly increased.

The probe offers unique features:
- excellent tip radius of curvature
- highly doped to dissipate static charge
- Al coating on detector side of cantilever
- high mechanical Q-factor for high sensitivity


shape: Standard

radius 7 nm - 10 nm


shape: beam

length 450 µm 440 - 460 µm -
width 55 µm 47.5 - 62.5 µm -
thikness 4 µm 3 - 5 µm -
force_constant 1.6 N/m 0.6 - 0.6 N/m -
resonance_frequency 27 kHz 19 - 35 kHz -
Артикул Цена Количество
488--PPP-ZEILR-10 37076.29
488--PPP-ZEILR-20 60042.35
488--PPP-ZEILR-50 122935.63
488--PPP-ZEILR-W 582052.56