PPP-SEIHR

Special Tapping Mode AFM Probe

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of a Seiko Instruments microscope using the non-contact mode we recommend NANOSENSORSPPP-SEIHR AFM probes (Seiko Instruments / high force constant). Compared with the ZEIHR type the force constant is further reduced.


    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - Al coating on detector side of cantilever
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

tip

shape: Standard

typicalfrom_toguaranteed
radius 7 nm - 10 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 215 - 235 µm -
width 33 µm 25 - 40 µm -
thikness 5 µm 4 - 6 µm -
force_constant 15 N/m 5 - 5 N/m -
resonance_frequency 130 kHz 96 - 175 kHz -
NANOSENSORS
Артикул Цена Количество
482--PPP-SEIHR-10 37076.29
482--PPP-SEIHR-20 60042.35
482--PPP-SEIHR-50 122935.63
482--PPP-SEIHR-W 582052.56