Standard Contact Mode AFM Probe

The new Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONTR type is optimized for high sensitivity due to a low force constant.

For certain applications the rotated PointProbe® Plus Tip offers more symmetric imaging. The rotated tip shape is identical to the classic tip shape but it is rotated by 180° degrees with respect to the cantilever beam direction.

    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - high mechanical Q-factor for high sensitivity


shape: Rotated

radius 7 nm - 10 nm


shape: beam

length 450 µm 440 - 460 µm -
width 50 µm 42.5 - 57.5 µm -
thikness 2 µm 1 - 3 µm -
force_constant 0.2 N/m 0.02 - 0.02 N/m -
resonance_frequency 13 kHz 6 - 21 kHz -
Артикул Цена Количество
478--PPP-RT-CONTR-10 37076.29
478--PPP-RT-CONTR-20 60042.35
478--PPP-RT-CONTR-50 122935.63