Electrical, Soft Tapping Mode AFM Probe

The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape.

NANOSENSORS™ PPP-NCSTPt AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.

    The probe offers unique features:
        - metallic conductivity of the tip
        - high mechanical Q-factor for high sensitivity

Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.


shape: Standard



shape: beam

length 150 µm 140 - 160 µm -
width 27 µm 19.5 - 34.5 µm -
thikness 2.8 µm 1.8 - 3.8 µm -
force_constant 7.4 N/m 1.2 - 1.2 N/m -
resonance_frequency 160 kHz 75 - 265 kHz -
Артикул Цена Количество
472--PPP-NCSTPt-10 48875.37
472--PPP-NCSTPt-20 81006.77
472--PPP-NCSTPt-50 168867.74
472--PPP-NCSTPt-W 814978.94