PPP-NCLR

Tapping Mode AFM Probe, Long Cantilever

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS™ PPP-NCLR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLR is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
 
    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - Al coating on detector side of cantilever
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.

tip

shape: Standard

typicalfrom_toguaranteed
radius 7 nm - 10 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 215 - 235 µm -
width 38 µm 30 - 45 µm -
thikness 7 µm 6 - 8 µm -
force_constant 48 N/m 21 - 21 N/m -
resonance_frequency 190 kHz 146 - 236 kHz -
NANOSENSORS
Артикул Цена Количество
468--PPP-NCLR-10 37076.29
468--PPP-NCLR-20 60042.35
468--PPP-NCLR-50 122935.63
468--PPP-NCLR-W 582052.56