PPP-NCH

Standard Tapping Mode AFM Probe

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape.

The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

 

NANOSENSORSPPP-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.                                                                           
   

     This AFM probe offers unique features:
         - excellent tip radius of curvature
         - highly doped to dissipate static charge
         - chemically inert
         - high mechanical Q-factor for high sensitivity

tip

shape: Standard

typicalfrom_toguaranteed
radius 7 nm - 10 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm 115 - 135 µm -
width 30 µm 22.5 - 37.5 µm -
thikness 4 µm 3 - 5 µm -
force_constant 42 N/m 10 - 10 N/m -
resonance_frequency 330 kHz 204 - 497 kHz -
NANOSENSORS
Артикул Цена Количество
459--PPP-NCH-10 37076.29
459--PPP-NCH-20 60042.35
459--PPP-NCH-50 122935.63
459--PPP-NCH-W 582052.56