PPP-FMAu

Gold Coated Force Modulation AFM Probe

The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.

NANOSENSORS™ PPP-FMAu is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability. 

    The probe offers unique features:
        - metallic conductivity of the tip
        - Au coating on both sides of the cantilever
        - chemically inert

Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.

tip

shape: Standard

typicalfrom_toguaranteed
radius 7 nm - 10 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 215 - 235 µm -
width 30 µm 20 - 35 µm -
thikness 3 µm 2 - 4 µm -
force_constant 2.8 N/m 0.5 - 0.5 N/m -
resonance_frequency 75 kHz 45 - 115 kHz -
NANOSENSORS
Артикул Цена Количество
452--PPP-FMAu-10 42870.48