Gold Coated Contact Mode AFM Probe with Short Cantilever

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape.

The NANOSENSORS™ PPP-CONTSCAu is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

    The probe offers unique features:

        - metallic conductivity of the tip
        - Au coating on both sides of the cantilever
        - chemically inert
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage of
          the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

Please note: Wear at the tip can occur if operating in contact-, friction- or force modulation mode.


shape: Standard



shape: beam

length 225 µm 215 - 235 µm -
width 48 µm 40 - 55 µm -
thikness 1 µm 0.1 - 2 µm -
force_constant 0.2 N/m 0.01 - 0.01 N/m -
resonance_frequency 23 kHz 1 - 57 kHz -
Артикул Цена Количество
446--PPP-CONTSCAu-10 42870.48