Contact Mode AFM Probe with Short Cantilever

The new PointProbe®Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

The NANOSENSORSPPP-CONTSC is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

    The probe offers unique features:
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series


shape: Standard

radius 7 nm - 10 nm


shape: beam

length 225 µm 215 - 235 µm -
width 48 µm 40 - 55 µm -
thikness 1 µm 0.1 - 2 µm -
force_constant 0.2 N/m 0.01 - 0.01 N/m -
resonance_frequency 25 kHz 1 - 57 kHz -
Артикул Цена Количество
445--PPP-CONTSC-10 37076.29
445--PPP-CONTSC-20 60042.35
445--PPP-CONTSC-50 122935.63
445--PPP-CONTSC-W 582052.56