Silicon Nitride AFM Probe

Leading edge in sharpness and durability

The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips. This probe series features a support chip that is made of Pyrex. Two chip versions are available: The DB series with rectangular / diving board cantilevers and the TR series having triangular cantilevers. Both sides of the chip have identical cantilevers. All cantilevers are stress compensated and have a 70 nm chromium / gold backside coating for high laser reflectivity.

All chips are pre-separated prior to shipment and come in Gel-Pak containers.

Additionally this probe offers an excellent tip radius of curvature. The cantilever bending is below 2°.


shape: Pyramid

height 3.5 µm - -
radius 10 nm - -


shape: beam

length 100 µm - -
width 40 µm - -
thikness 0.5 µm - -
force_constant 0.48 N/m - -
resonance_frequency 67 kHz - -
Артикул Цена Количество
435--PNP-DB-20 43081.18
435--PNP-DB-50 90909.57