PL2-NCH

Tapping Mode AFM Probe with Plateau Tip

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:
- plateau diameter of typically 1.8 µm
- single crystalline silicon
- highly doped to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity

tip

shape: Plateau

typicalfrom_toguaranteed
plateau - - -
plateau - - -
plateau - - -
plateau - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm 115 - 135 µm -
width 30 µm 22.5 - 37.5 µm -
thikness 4 µm 3 - 5 µm -
force_constant 42 N/m 10 - 10 N/m -
resonance_frequency 330 kHz 204 - 497 kHz -
NANOSENSORS
Артикул Цена Количество
431--PL2-NCH-10 88802.59