PL2-CONTR

Contact Mode AFM Probe with Plateau Tip

The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a micromechanical cantilever. This plateau is formed by focused ion beam milling out of a symmetrically etched tip building a rod on top of a conical tip.

NANOSENSORS™ PL2-CONTR AFM probes are designed for contact mode (repulsive mode) AFM imaging. This probe can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.

Upon request customized larger plateau diameters can be realized. Other shapes are also possible upon request.

The probe offers unique features:
- plateau diameter of typically 1.8 µm
- single crystalline silicon
- highly doped to dissipate static charge
- Al coating on detector side of cantilever
- chemically inert
- high mechanical Q-factor for high sensitivity

tip

shape: Plateau

typicalfrom_toguaranteed
plateau - - -
plateau - - -
plateau - - -
plateau - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm 440 - 460 µm -
width 50 µm 42.5 - 57.5 µm -
thikness 2 µm 1 - 3 µm -
force_constant 0.2 N/m 0.02 - 0.02 N/m -
resonance_frequency 13 kHz 6 - 21 kHz -
NANOSENSORS
Артикул Цена Количество
428--PL2-CONTR-10 88802.59