NW-SSS-NCH

SuperSharp, Tapping Mode AFM Probe

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 -15 µm.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

 

This probe offers unique features:

- Typical tip radius of curvature of 2 nm

- Guaranteed tip radius of curvature 5 nm (yield >80%)

- Half cone angle < 10° at the last 200 nm of the tip

tip

shape: Supersharp

typicalfrom_toguaranteed
height - 10 - 15 µm -
radius 2 nm - 5 nm
half_cone_angle - - -

cantilever

shape: undefined

typicalfrom_toguaranteed
width 30 µm 25 - 35 µm -
thikness 4 µm 3.5 - 4.5 µm -
force_constant 42 N/m 21 - 21 N/m -
resonance_frequency 320 kHz 250 - 390 kHz -
NanoWorld
Артикул Цена Количество
423--NW-SSS-NCH-10 76266.07
423--NW-SSS-NCH-20 130204.7
423--NW-SSS-NCH-50 277482.44
423--NW-SSS-NCH-W 1365216.14
423--ESD-Kit 15374.42