NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
The CDT features a conductive diamond coating. Some typical applications for this tip are Scanning Spreading Resistance Microscopy (SSRM), Tunneling AFM (Conducting AFM) and Scanning Capacitance Microscopy (SCM).

tip

shape: Standard

typicalfrom_toguaranteed
height - 10 - 15 µm - radius - - 200 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm 120 - 130 µm -
width 30 µm 25 - 35 µm -
thikness 4 µm 3.5 - 4.5 µm -
force_constant 80 N/m 42 - 42 N/m -
resonance_frequency 400 kHz 280 - 510 kHz -
NanoWorld
Артикул Цена Количество
643--NW-CDT-NCHR-10 144532.15
643--NW-CDT-NCHR-20 252304.05
643--NW-CDT-NCHR-50 538859.52