NSC18/Hard Al BS

Long Scanning, DLC Hardened Force Modulation AFM Probe

Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This product features alignment grooves on the back side of the holder chip.


shape: Rotated

height 15 nm 12 - 18 nm -
radius 20 nm - -
full_cone_angle - - -


shape: beam

length 225 µm - -
width 27.5 µm - -
thikness 3 µm - -
force_constant 2.8 N/m 1.2 - 1.2 N/m -
resonance_frequency 75 kHz 60 - 90 kHz -
Артикул Цена Количество
943--HQ-NSC18-HardAl-BS-15 49086.06
943--HQ-NSC18-HardAl-BS-50 113348.88