Tapping Mode AFM Probe, Long Cantilever

NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping™ mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.


shape: Standard

height - 10 - 15 µm -
radius 8 nm - 12 nm


shape: beam

length 225 µm 220 - 230 µm -
width 38 µm 33 - 43 µm -
thikness 7 µm 6.5 - 7.5 µm -
force_constant 48 N/m 31 - 31 N/m -
resonance_frequency 190 kHz 160 - 210 kHz -
Артикул Цена Количество
408--NCL-10 35285.36
408--NCL-20 56776.53
408--NCL-50 115771.9
408--NCL-W 553292.32