NCH

Standard Tapping Mode AFM Probe

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping  mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

tip

shape: Standard

typical from_to guaranteed
height - 10 - 15 µm -
radius 8 nm - 12 nm

cantilever

shape: beam

typical from_to guaranteed
length 125 µm 120 - 130 µm -
width 30 µm 25 - 35 µm -
thikness 4 µm 3.5 - 4.5 µm -
force_constant 42 N/m 21 - 21 N/m -
resonance_frequency 320 kHz 250 - 390 kHz -
NanoWorld
Артикул Цена Количество
405--NCH-10 35285.36
405--NCH-20 56776.53
405--NCH-50 115771.9
405--NCH-W 553292.32