HiRes-C19/Cr-Au

High Resolution, Force Modulation Mode AFM Probe

Cantilevers of the 19 series combine the high frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in Tapping mode.

High-resolution probe with a hydrophobic diamond-like extratip at the apex of the silicon etched probe.

This product features alignment grooves on the back side of the holder chip.

tip

shape: Custom, Supersharp, Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 1 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm - -
width 22.5 µm - -
thikness 1 µm - -
force_constant 0.5 N/m 0.05 - 0.05 N/m -
resonance_frequency 65 kHz 25 - 120 kHz -
MikroMasch
Артикул Цена Количество
885--HiRes-C19-Cr-Au-5 50139.55
885--HiRes-C19-Cr-Au-15 102813.99
885--ESD-Kit 15374.42