HQ:XSC11/Pt

AFM Probe with 4 Different Electrical Cantilevers

Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 30 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 500 µm - -
width 30 µm - -
thikness 2.7 µm - -
force_constant 0.2 N/m 0.1 - 0.1 N/m -
resonance_frequency 15 kHz 12 - 18 kHz -
MikroMasch
Артикул Цена Количество
850--HQ-XSC11-Pt-15 49086.06
850--HQ-XSC11-Pt-50 113348.88
850--HQ-XSC11-Pt-100 197627.98