HQ:NSC36/Pt

AFM Probe with 3 Different Electrical, Force Modulation Mode Cantilevers

Probes of the 36 series have three different force modulation mode cantilevers on one side of the holder chip. They are suitable for different electrical measurements.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 30 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 110 µm - -
width 32.5 µm - -
thikness 1 µm - -
force_constant 1 N/m 0.1 - 0.1 N/m -
resonance_frequency 90 kHz 30 - 160 kHz -
MikroMasch
Артикул Цена Количество
844--HQ-NSC36-Pt-15 45925.6
844--HQ-NSC36-Pt-50 102813.99
844--HQ-NSC36-Pt-100 178665.19