HQ:NSC19/Cr-Au

Gold Coated Force Modulation Mode AFM Probe

Cantilevers of the 19 series combine the high frequency and low spring constant, which makes them applicable to imaging soft and fragile surfaces at a relatively high speed in Tapping mode. The cantilevers may also be useful in LFM due to the high sensitivity to the lateral forces.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.

This product features alignment grooves on the back side of the holder chip.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 35 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm - -
width 22.5 µm - -
thikness 1 µm - -
force_constant 0.5 N/m 0.05 - 0.05 N/m -
resonance_frequency 65 kHz 25 - 120 kHz -
MikroMasch
Артикул Цена Количество
893--HQ-NSC19-Cr-Au-15 45925.6
893--HQ-NSC19-Cr-Au-50 102813.99
893--HQ-NSC19-Cr-Au-100 178665.19