HQ:NSC16/Hard/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe with Long Cantilever

These cantilevers with the high spring constant and the low resonant frequency (below 250 kHz) can be used in Tapping mode in SPM that has a low-frequency feedback loop. These cantilevers also fit SPM systems that do not support probes with short lever arms.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This product features alignment grooves on the back side of the holder chip.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 20 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm - -
width 37.5 µm - -
thikness 7 µm - -
force_constant 45 N/m 30 - 30 N/m -
resonance_frequency 190 kHz 170 - 210 kHz -
MikroMasch
Артикул Цена Количество
898--HQ-NSC16-Hard-Al-BS-15 49086.06
898--HQ-NSC16-Hard-Al-BS-50 113348.88