HQ:NSC15/Pt

Electrical, Tapping Mode AFM Probe

Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact mode.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

This product features alignment grooves on the back side of the holder chip.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 30 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm - -
width 30 µm - -
thikness 4 µm - -
force_constant 40 N/m 20 - 20 N/m -
resonance_frequency 325 kHz 265 - 410 kHz -
MikroMasch
Артикул Цена Количество
828--HQ-NSC15-Pt-15 45925.6
828--HQ-NSC15-Pt-50 102813.99
828--HQ-NSC15-Pt-100 178665.19