HQ:NSC15/Hard/Al BS

Long Scanning, DLC Hardened Tapping Mode AFM Probe

Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also good for non-contact mode.

A wear-resistant coating with thickness 20 nm is applied to the tipside of the cantilever. The coating is chemically inert and more hydrophobic than Si with natural oxide layer.

This product features alignment grooves on the back side of the holder chip.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 20 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm - -
width 30 µm - -
thikness 4 µm - -
force_constant 40 N/m 20 - 20 N/m -
resonance_frequency 325 kHz 265 - 410 kHz -
MikroMasch
Артикул Цена Количество
826--HQ-NSC15-Hard-Al-BS-15 49086.06
826--HQ-NSC15-Hard-Al-BS-50 113348.88