HQ:NSC14/Pt

Electrical, Soft Tapping Mode AFM Probe

Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

This product features alignment grooves on the back side of the holder chip.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 30 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm - -
width 25 µm - -
thikness 2.1 µm - -
force_constant 5 N/m 1.8 - 1.8 N/m -
resonance_frequency 160 kHz 110 - 220 kHz -
MikroMasch
Артикул Цена Количество
860--HQ-NSC14-Pt-15 45925.6
860--HQ-NSC14-Pt-50 102813.99
860--HQ-NSC14-Pt-100 178665.19