HQ:DPER-XSC11

AFM Probe with 4 Different Electrical Cantilevers

Probes of the 11 series have four different cantilevers, two on each side of the holder chip. They can be used in various applications.

The DPER probes are made by depositing a thin metal coating on Si tips. The thickness of the coating on the flat cantilever surface is about 15 nm, resulting in a coated tip radius below 20 nm. The probes can be used for imaging samples with higher resolution in XY directions.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 20 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 500 µm - -
width 30 µm - -
thikness 2.7 µm - -
force_constant 0.2 N/m 0.1 - 0.1 N/m -
resonance_frequency 15 kHz 12 - 18 kHz -
MikroMasch
Артикул Цена Количество
894--HQ-DPER-XSC11-15 55407
894--HQ-DPER-XSC11-50 129151.21
894--HQ-DPER-XSC11-100 229232.65