HQ:CSC37/Pt

AFM Probe with 3 Different Electrical, Contact Mode Cantilevers

Probes of the 37 series have three different contact mode cantilevers on one side of the holder chip. They can be used for different electrical measurements.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 30 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 250 µm - -
width 35 µm - -
thikness 2 µm - -
force_constant 0.8 N/m 0.3 - 0.3 N/m -
resonance_frequency 40 kHz 30 - 55 kHz -
MikroMasch
Артикул Цена Количество
882--HQ-CSC37-Pt-15 45925.6
882--HQ-CSC37-Pt-50 102813.99
882--HQ-CSC37-Pt-100 178665.19