HQ:CSC37/Cr-Au

AFM Probe with 3 Different Gold Coated Contact Mode Cantilevers

Probes of the 37 series have three different contact mode cantilevers on one side of the holder chip. They can be used in various applications.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 35 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 250 µm - -
width 35 µm - -
thikness 2 µm - -
force_constant 0.8 N/m 0.3 - 0.3 N/m -
resonance_frequency 40 kHz 30 - 55 kHz -
MikroMasch
Артикул Цена Количество
881--HQ-CSC37-Cr-Au-15 45925.6
881--HQ-CSC37-Cr-Au-50 102813.99
881--HQ-CSC37-Cr-Au-100 178665.19