HQ:CSC17/Pt

Electrical, Contact Mode AFM Probe

Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

This product features alignment grooves on the back side of the holder chip.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 30 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm - -
width 50 µm - -
thikness 2 µm - -
force_constant 0.18 N/m 0.06 - 0.06 N/m -
resonance_frequency 13 kHz 10 - 17 kHz -
MikroMasch
Артикул Цена Количество
864--HQ-CSC17-Pt-15 45925.6
864--HQ-CSC17-Pt-50 102813.99
864--HQ-CSC17-Pt-100 178665.19