HQ:CSC17/Cr-Au

Gold Coated Contact Mode AFM Probe

Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.

This product features alignment grooves on the back side of the holder chip.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 35 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm - -
width 50 µm - -
thikness 2 µm - -
force_constant 0.18 N/m 0.06 - 0.06 N/m -
resonance_frequency 13 kHz 10 - 17 kHz -
MikroMasch
Артикул Цена Количество
863--HQ-CSC17-Cr-Au-15 45925.6
863--HQ-CSC17-Cr-Au-50 102813.99
863--HQ-CSC17-Cr-Au-100 178665.19