HQ:CSC17/Al BS

Standard Contact Mode AFM Probe

Cantilevers of the 17 series with the low spring constant are used in contact mode AFM mostly. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of the soft samples.

This product features alignment grooves on the back side of the holder chip.

tip

shape: Rotated

typicalfrom_toguaranteed
height 15 µm 12 - 18 µm -
radius 8 nm - -
full_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm - -
width 50 µm - -
thikness 2 µm - -
force_constant 0.18 N/m 0.06 - 0.06 N/m -
resonance_frequency 13 kHz 10 - 17 kHz -
MikroMasch
Артикул Цена Количество
861--HQ-CSC17-Al-BS-15 39604.66
861--HQ-CSC17-Al-BS-50 97546.55
861--HQ-CSC17-Al-BS-100 169183.79
861--HQ-CSC17-Al-BS-200 294548.95
861--HQ-CSC17-Al-BS-400 437823.43