FMR

Standard Force Modulation AFM Probe

NanoWorld PointProbe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally this probe offers excellent tip radius of curvature.

tip

shape: Standard

typicalfrom_toguaranteed
height - 10 - 15 µm -
radius 8 nm - 12 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 220 - 230 µm -
width 28 µm 22.5 - 32.5 µm -
thikness 3 µm 2.5 - 3.5 µm -
force_constant 2.8 N/m 1.2 - 1.2 N/m -
resonance_frequency 75 kHz 60 - 90 kHz -
NanoWorld
Артикул Цена Количество
376--FMR-10 38024.43
376--FMR-20 61727.93
376--FMR-50 126517.49
376--FMR-W 608600.48