Standard Force Modulation AFM Probe

NanoWorld Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10-15 µm

Additionally this probe offers typical tip radius of curvature of less than 8 nm.


shape: Standard

height-10 - 15 µm-
radius8 nm--


shape: Beam

length225 µm220 - 230 µm-
width28 µm22.5 - 32.5 µm-
thickness3 µm2.5 - 3.5 µm-
force_constant2.8 N/m1.2 - 5.5 N/m-
resonance_frequency75 kHz60 - 90 kHz-
Артикул Цена Количество
375--FM-10 35285.36
375--FM-20 56776.53
375--FM-50 115771.9
375--FM-W 553292.32