FESP

Standard Force Modulation AFM Probe

NanoWorld PointProbe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping™ mode imaging is possible with this AFM probe. All probes of the PointProbe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally this probe offers excellent tip radius of curvature.

 
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Veeco Instruments Inc. is no longer selling this probe which has always been manufactured by NanoWorld®.

tip

shape: Standard

typicalfrom_toguaranteed
height - 10 - 15 µm -
radius 8 nm - 12 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 220 - 230 µm -
width 28 µm 22.5 - 32.5 µm -
thikness 3 µm 2.5 - 3.5 µm -
force_constant 2.8 N/m 1.2 - 1.2 N/m -
resonance_frequency 75 kHz 60 - 90 kHz -
NanoWorld
Артикул Цена Количество
374--FESP-10 35285.36
374--FESP-20 56776.53
374--FESP-50 115771.9
374--FESP-W 553292.32