ElectriTap300

Electrical, Tapping Mode AFM Probe

Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for non-contact high frequency applications (intermittent contact, tapping in air) and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).

Consistent high quality at a lower price!

tip

shape: Rotated

typicalfrom_toguaranteed
height 17 µm 15 - 19 µm -
setback 15 µm 10 - 20 µm -
radius 25 nm - -
half_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 125 µm 115 - 135 µm -
width 30 µm 25 - 35 µm -
thikness 4 µm 3 - 5 µm -
force_constant 40 N/m 20 - 20 N/m -
resonance_frequency 300 kHz 200 - 400 kHz -
BudgetSensors
Артикул Цена Количество
372--Tap300E-10 31071.4
372--Tap300E-50 103867.48
372--Tap300E-G-10 31071.4
372--Tap300E-G-50 103867.48