ElectriTap190-G

Electrical, Tapping Mode AFM Probe with a Long Cantilever

Rotated, monolithic silicon AFM probe for non-contact applications (intermittent contact, tapping in air), with long cantilever and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

Symmetric tip shape;

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).

BudgetSensors' Tap190 series feature a longer cantilever and it's meant as an alternative to BudgetSensors' Tap300 probes series, when the feedback loop of the AFM system doesn't accept high frequencies (400 kHz) or when the detection system needs a minimum cantilever length > 125 µm. The scanning speed of Tap190 series AFM probes is slightly slower than the scanning speed of the Tap300 series.

Consistent high quality at a lower price!

tip

shape: Rotated

typicalfrom_toguaranteed
height 17 µm 15 - 19 µm -
setback 15 µm 10 - 20 µm -
radius 25 nm - -
half_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 213 - 237 µm -
width 38 µm 29 - 47 µm -
thikness 7 µm 6 - 8 µm -
force_constant 48 N/m 20 - 20 N/m -
resonance_frequency 190 kHz 130 - 250 kHz -
BudgetSensors
Артикул Цена Количество
371--Tap190E-G-10 31071.4
371--Tap190E-G-50 103867.48